Photodetector architectures for efficient fast-gating comprising a control system controlling a current drawn by an array of photodetectors with a single photon avalanche diode

ABSTRACT

An exemplary system includes an array of photodetectors and a control system. Each photodetector of the array of photodetectors may include a single-photon avalanche diode (SPAD) and a fast-gating circuit configured to arm and disarm the SPAD. The control system is configured to control a current drawn by the array of photodetectors.

RELATED APPLICATIONS

The present application claims priority under 35 U.S.C. § 119(e) to U.S.Provisional Patent Application No 62/889,999, filed Aug. 21, 2019, andto U.S. Provisional Patent Application No. 62/851,071, filed May 21,2019. These applications are incorporated herein by reference in theirrespective entireties.

BACKGROUND INFORMATION

Detecting neural activity in the brain is useful for medicaldiagnostics, imaging, neuroengineering, brain-computer interfacing, anda variety of other diagnostic and consumer-related applications. Forexample, it may be desirable to detect neural activity in the brain of apatient to determine if a particular region of the brain has beenimpacted by reduced blood irrigation, a hemorrhage, or any other type ofdamage. As another example, it may be desirable to detect neuralactivity in the brain of a user and computationally decode the detectedneural activity into commands that can be used to control various typesof consumer electronics (e.g., by controlling a cursor on a computerscreen, changing channels on a television, turning lights on, etc.).

A photodetector that employs a semiconductor-based single-photonavalanche diode (SPAD) is capable of capturing individual photons withvery high time-of-arrival resolution (a few tens of picoseconds). Whenphotons are absorbed by a SPAD, their energy frees bound charge carriers(electrons and holes) that then become free-carrier pairs. In thepresence of an electric field created by a reverse bias voltage appliedto the diode, these free-carriers are accelerated through a region ofthe SPAD referred to as the multiplication region. As the free carrierstravel through the multiplication region, they collide with othercarriers bound in the atomic lattice of the semiconductor, therebygenerating more free carriers through a process called impactionization. These new free-carriers also become accelerated by theapplied electric field and generate yet more free-carriers. Thisavalanche event can be detected and used to determine an arrival time ofthe photon.

In order to enable detection of a single photon, a SPAD is biased with areverse bias voltage having a magnitude greater than the magnitude ofits breakdown voltage, which is the bias level above which free-carriergeneration can become self-sustaining and result in a runaway avalanche.This biasing of the SPAD is referred to as arming the device. When theSPAD is armed, a single free carrier pair created by the absorption of asingle photon can create a runaway avalanche resulting in an easilydetectable macroscopic current. However, arming an array of SPADs for alarge number of light pulses, which may be typical for detecting neuralactivity, consumes a relatively high amount of power.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings illustrate various embodiments and are a partof the specification. The illustrated embodiments are merely examplesand do not limit the scope of the disclosure. Throughout the drawings,identical or similar reference numbers designate identical or similarelements.

FIGS. 1-6 illustrate exemplary configurations of efficient fast-gatingphotodetector systems according to principles described herein.

FIG. 7A illustrates an exemplary timing diagram for a conventionalphotodetector system.

FIG. 7B illustrates an exemplary timing diagram for an efficientfast-gating photodetector system according to principles describedherein.

FIG. 8 illustrates an exemplary photodetector of an efficientfast-gating photodetector system according to principles describedherein.

FIG. 9A illustrates an exemplary photodetector array of an efficientfast-gating photodetector system according to principles describedherein.

FIG. 9B illustrates an exemplary wearable device including an efficientfast-gating photodetector system according to principles describedherein.

FIG. 10 illustrates an exemplary computing device according toprinciples described herein.

DETAILED DESCRIPTION

Photodetector systems with efficient fast-gating architectures aredescribed herein. The photodetector systems described herein eachinclude an array of photodetectors. Each array of photodetectors mayinclude a single-photon avalanche diode (SPAD) and a fast-gating circuitconfigured to arm and disarm the SPAD. The photodetector system alsoincludes a control system for controlling a current drawn by the arrayof photodetectors.

For example, the control system may include a plurality of switchesconfigured to control a slew rate of the array of photodetectors.Additionally or alternatively, the control system may include aplurality of voltage sources, configured such that SPADs in the array ofphotodetectors may be selectively armed. Additionally or alternatively,the control system may include a switch to abstain from disarming SPADsduring one or more measurement time periods while the switch is enabled.Additionally or alternatively, the control system may include a timerconfigured to disarm SPADs for a particular amount of time subsequent tothe SPADs detecting photons.

These and other example embodiments of a control system configured tocontrol a current drawn by the array of photodetectors are describedherein. By controlling the current drawn by the array of photodetectors(e.g., decreasing the current drawn relative to a conventionalphotodetector system), the control system may enable the photodetectorsystem to consume less power as compared to a conventional photodetectorsystem. Further, controlling the current drawn by the array ofphotodetectors may prevent voltage ripples in inductive components thatmay potentially affect timing certainty and uniformity betweenphotodetector arrays. These and other benefits and/or advantages thatmay be provided by the systems and methods described herein will be madeapparent by the following detailed description.

FIG. 1 illustrates an exemplary efficient fast-gating photodetectorsystem 100. Fast-gating photodetector system 100 shows a photodetectorarray 102 that includes photodetectors 104 (e.g., photodetectors 104-1through 104-N). Each photodetector 104 includes a single-photonavalanche diode (SPAD) 106 (e.g., SPAD 106-1 through 106-N) and a SPADcircuit 108 (e.g., SPAD circuit 108-1 through 108-N) configured tocontrol a corresponding SPAD 106. For example, photodetector 104-1includes a SPAD 106-1 and a SPAD circuit 108-1 configured to controlSPAD 102-1. Fast-gating photodetector system 100 also includes a controlsystem 110 configured to control a current drawn by photodetector array102. While control system 110 is shown as a separate system fromphotodetector array 102 in configuration 100, control system 110 orcomponents of control system 110 may, in certain embodiments, beintegrated into photodetector array 102 and/or photodetectors 104 (e.g.,SPAD circuits 108). Example embodiments are described herein.

SPAD 106 may be implemented by any suitable single-photon avalanchediode configured to detect single photons. SPAD circuit 108 includes afast-gating circuit (which may include a reset circuit) and may alsoinclude a quench circuit, implemented in any suitable manner. ExampleSPADs and SPAD circuits include those described in U.S. Pat. No.10,158,038, incorporated herein by reference in its entirety.

FIG. 2 illustrates an exemplary implementation 200 of fast-gatingphotodetector system 100. Implementation 200 shows a SPAD 202 connectedat an anode 204 to a gating transistor 206, a reset transistor 208, anda quenching transistor 210. SPAD 202 implements any one of SPADs 106(FIG. 1). Gating transistor 206, reset transistor 208, and quenchingtransistor 210 together (along with any other suitable components)implement any one of SPAD circuits 108 (FIG. 1). Gating transistor 206is configured to arm SPAD 202 and is gated by a gating voltage,V_(SPADon). Reset transistor 208 is configured to reset (e.g., disarm)SPAD 202 and is gated by a reset signal SPADOFF. Quenching transistor210 is configured to control an avalanche current (e.g., a current drawnby SPAD 202 when SPAD 202 detects a photon) drawn by SPAD 202. Quenchingtransistor 210 is gated by a quenching voltage V_(quench). In someembodiments, quenching transistor 210 may be omitted from the SPADcircuit, in which case the avalanche current may be controlled by gatingtransistor 206.

Implementation 200 also shows components of a control system (e.g., animplementation of control system 110) configured to control a currentdrawn by the SPAD circuit. The components include a plurality ofbranches 212 (e.g., branches 212-1 through 212-N) that are connected toanode 204 of SPAD 202 in parallel with gating transistor 206. Eachbranch 212 of the plurality of branches includes a switch 216 (e.g.,switch 216-1 through switch 216-N, implemented in configuration 200 bytransistors). Each branch 212 also includes an additional transistor 214gated by V_(SPADon).

Branches 212 are configured to control the current of the SPAD circuitby controlling a slew rate (e.g., a change in current per unit of time)of the SPAD circuit as SPAD 202 is armed and/or disarmed. Additionaltransistor 214 of each branch 212 may control a discharge of anode 204of SPAD 202. Thus, the slew rate may be controlled based on switches216. As more switches 216 are closed, the slew rate may be set to behigher. For example, a relatively fast slew rate may be set by closingswitches 216 on all branches 212 (e.g., by setting B0 to BN all tohigh). Conversely, a relatively slow slew rate may be set by openingswitches 216 (e.g., by setting B0 to BN all to low). The plurality ofbranches 212 may allow for a range of slew rates (e.g., between (andincluding) closing all switches 216 and opening all switches 216). As aresult, the control system may optimize the current drawn by the SPADcircuit by setting the slew rate to a highest rate that may ensureadequate voltage ripple and data quality. Further, the control systemmay adapt the current drawn by the SPAD circuit based on variousconditions and/or applications by opening or closing switches 216 asdesired.

While implementation 200 shows each branch 212 with additionaltransistor 214 connected between switch 216 and anode 204 of SPAD 202,in some embodiments, transistor 214 may be connected below switch 216,such that each branch has switch 216 connected to anode 204 of SPAD 202and transistor 214 connected between switch 216 and ground.

FIG. 3 illustrates another exemplary implementation 300 of fast-gatingphotodetector system 100. Implementation 300 is similar toimplementation 200 in that implementation 300 includes a SPAD 302, agating transistor 306, a reset transistor 308, and a quenchingtransistor 310. In implementation 300, gating transistor 306, resettransistor 308, and quenching transistor 310 connect to a cathode 304 ofSPAD 302. SPAD 302 implements any one of SPADs 106 (FIG. 1). Gatingtransistor 306, reset transistor 308, and quenching transistor 310together (along with any other suitable components) implement any one ofSPAD circuits 108 (FIG. 1). Gating transistor 306 is configured to armSPAD 302 and is gated by a gating signal, SPADON. Reset transistor 308is configured to reset SPAD 302 and is gated by a reset signalV_(SPADoff). Quenching transistor 310 is configured to control anavalanche current drawn by SPAD 302. Quenching transistor 310 is gatedby a quenching voltage V_(quench). In some embodiments, quenchingtransistor 310 may be omitted from the SPAD circuit, in which case theavalanche current may be controlled by gating transistor 306.

Implementation 300 also shows components of a control system (e.g., animplementation of control system 110) configured to control a currentdrawn by the SPAD circuit. The components include a plurality ofbranches 312 (e.g., branches 312-1 through 312-N). However, where inimplementation 200, branches 212 are connected to anode 204 of SPAD 202in parallel with gating transistor 206, in implementation 300, branches312 are connected in parallel between cathode 304 of SPAD 302 and resettransistor 308. Otherwise, like branches 212, each branch 312 of theplurality of branches includes a switch 316 (e.g., switch 316-1 throughswitch 316-N, implemented in implementation 300 by transistors). Eachbranch 312 also includes an additional transistor 314 gated by SPADON.

Branches 312 may be configured to control a slew rate of the SPADcircuit in a similar manner as branches 212 control the slew rate of theSPAD circuit in implementation 200. Additionally, as with implementation200, in some embodiments switch 314 and additional transistor 316 may beswitched in placement order on each branch 312. Additionally, in someembodiments, the control system may include both pluralities of branches212 and branches 312 to control the current drawn by the SPAD circuit.

FIG. 4 illustrates another exemplary implementation 400 of fast-gatingphotodetector system 100 (FIG. 1). Implementation 400 includes aphotodetector array 402 that includes photodetectors 404 (e.g.,photodetectors 404-1 through 404-N). Each photodetector 404 includes asingle-photon avalanche diode (SPAD) 406 (e.g., SPAD 406-1 through406-N) and a SPAD circuit 408 (e.g., SPAD circuit 408-1 through 408-N).For example, photodetector 404-1 includes a SPAD 406-1 and a SPADcircuit 408-1.

Implementation 400 also includes components of a control system (e.g.,an implementation of control system 110) configured to control a currentdrawn by photodetector array 402. The components include a plurality ofvoltage sources 410 (e.g., voltage source 410-1 through 410-N).Photodetectors 404 may each be connected to a voltage source 410 of theplurality of voltage sources. Thus, photodetector array 402 may bedivided into subarrays, based on subsets of photodetectors 404 connectedto different voltage sources 410. For example, in implementation 400, afirst subset of photodetectors 404 includes photodetector 404-1 andphotodetector 404-2, both connected to voltage source 410-1. A secondsubset of photodetectors 404 includes photodetector 404-N, connected tovoltage source 410-N. Voltage sources 410 may be connected to a gate ofa gating transistor of a fast-gating circuit of each photodetector 404.Thus, each subset of photodetectors 404 may be configured to be armedtogether by each voltage source 410 to which the subset is connected.

With photodetector array 402 divided into subarrays, the control systemmay selectively arm subarrays. For example, the control system may armless than all photodetectors 404 in photodetector array 402, which wouldlessen a current drawn by photodetector array 402 than if allphotodetectors 404 were armed. Additionally or alternatively, subarraysmay be armed sequentially (e.g., within a measurement time periodsubsequent to a light pulse). Sequentially arming subarrays may resultin all photodetectors 404 being armed, but may reduce a maximum currentdrawn as photodetectors 404 are not all armed at once. Also, assubarrays draw current from different voltage sources, arming subarraysmay result in less current drawn per voltage source and thus a reductionin power supply ripple in the photodetector system compared to armingall photodetectors 404 from one power supply.

Further, subsets of photodetectors 404 may be organized based on acharacteristic of photodetectors 404 and/or a characteristic of a lightpulse response of a target that photodetectors 404 are configured tomeasure. For instance, a first subset of photodetectors 404 may have ahigher dark count rate than a second subset of photodetectors 404. Asphotodetectors 404 with higher dark count rates may be more susceptibleto noise, the first subset of photodetectors 404 may be armed for aportion of the light pulse response where more photons are detected,such as shortly after a light pulse is directed at the target. Thesecond subset of photodetectors 404 may be reserved for later in thelight pulse response, when fewer photons are detected, and less noise isdesirable. Additionally or alternatively, more subarrays ofphotodetectors and/or subarrays with more photodetectors may be armedfor those portions of the light pulse response where a lot of photonsare expected. Any such suitable characteristics of photodetectors 404and light pulse responses may be used to organize the subarrays.

FIG. 5 illustrates another exemplary implementation 500 of fast-gatingphotodetector system 100 (FIG. 1). Implementation 500 includes a SPAD502 connected at an anode 504 to a gating transistor 506, a resettransistor 508, and a quenching transistor 510. SPAD 502 implements anyone of SPADs 106 (FIG. 1). Gating transistor 506, reset transistor 508,and quenching transistor 510 together (along with any other suitablecomponents) implement any one of SPAD circuits 108 (FIG. 1). Gatingtransistor 506 is configured to arm SPAD 502 and is gated by a gatingvoltage, V_(SPADon). Reset transistor 508 is configured to reset SPAD502 and is gated by a reset signal SPADOFF. Quenching transistor 510 isconfigured to control an avalanche current drawn by SPAD 502. Quenchingtransistor 510 is gated by a quenching voltage V_(quench). In someembodiments, quenching transistor 510 may be omitted from the SPADcircuit, in which case the avalanche current may be controlled by gatingtransistor 506.

Implementation 500 also shows a component of a control system (e.g., animplementation of control system 110) configured to control a currentdrawn by the SPAD circuit. The component includes an OR gate 512 coupledto a gate of reset transistor 508 to abstain from disarming SPAD 502during one or more measurement time periods. SPAD 502 may be configuredto detect photons during a measurement time period after a light pulseis directed at a target. The light pulses may be repeated many times,with a measurement time period after each one. In a conventionalphotodetector system, a SPAD may be reset after each measurement timeperiod so that the SPAD may be re-armed for the next measurement timeperiod.

In implementation 500, the control system may be configured to abstainfrom resetting SPAD 502. By abstaining from resetting SPAD 502, if SPAD502 has not detected a photon for a given measurement time period, SPAD502 does not disarm and remains armed for the next measurement timeperiod. By not having to re-arm SPAD 502, the SPAD circuit does not drawa current that would have been drawn to arm SPAD 502. As multiple SPADsin a photodetector array may not detect photons in each measurement timeperiod, abstaining from resetting all such SPADs may reduce an amount ofcurrent drawn by the photodetector array. If SPAD 502 does detect aphoton, the SPAD circuit (e.g., quenching transistor 510) quenches SPAD502, and then the fast-gating circuit (e.g., gating transistor 506) armsSPAD 502 for the next measurement time period.

The control system may implement abstaining from resetting using OR gate512. By providing a high signal on a NORESET input branch of OR gate512, an output of OR gate 512 will remain high, regardless of signalscoming through SPADOFF. As a result, transistor 508 will remain open andSPAD 502 will not be reset. The NORESET signal may be a global signalthat is provided to some or all of the SPADs in the photodetector array.While implementation 500 includes OR gate 512, any suitablecombinational logic gate or other component may be used to provide theglobal NORESET signal.

When the control system is abstaining from disarming the SPADs in thephotodetector array, the control system may also disregard photonsdetected outside a measurement time period. In some conventionalphotodetector systems, SPADs may be armed and disarmed so that the SPADsare only enabled to detect photons during the measurement time period.In implementation 500, however, if SPADs are not disarmed, the SPADs maydetect photons outside of the measurement time period, such as photonsdetected directly from a light pulse, rather than after having reflectedoff of a target. In such instances, photons detected outside of themeasurement time period may be disregarded.

FIG. 6 illustrates another exemplary implementation 600 of fast-gatingphotodetector system 100 (FIG. 1). Implementation 600 includes a SPAD602 connected at an anode 604 to a gating transistor 606, a resettransistor 608, and a quenching transistor 610. SPAD 602 implements anyone of SPADs 106 (FIG. 1). Gating transistor 606, reset transistor 608,and quenching transistor 610 together (along with any other suitablecomponents) implement any one of SPAD circuits 108 (FIG. 1). Gatingtransistor 606 is configured to arm SPAD 602 and is gated by a gatingvoltage, V_(SPADon). Reset transistor 608 is configured to reset SPAD602 and is gated by a reset signal SPADOFF. Quenching transistor 610 isconfigured to control an avalanche current drawn by SPAD 602. Quenchingtransistor 610 is gated by a quenching voltage V_(quench). In someembodiments, quenching transistor 610 may be omitted from the SPADcircuit, in which case the avalanche current may be controlled by gatingtransistor 606.

Implementation 600 also shows a component of a control system (e.g., animplementation of control system 110) configured to control a currentdrawn by the SPAD circuit. The component includes a timer 612 coupled toa gate of gating transistor 606. Timer 612 is configured to disarm SPAD602 subsequent to SPAD 602 detecting a photon until a particular pointin time relative to a light pulse. By delaying a re-arming of SPAD 602and enforcing a dead time, the control system may prevent current beingdrawn by the SPAD circuit by a double-triggering event. Whileimplementation 600 shows timer 612 coupled to the gate of gatingtransistor 606, in other implementations, timer 612 may be coupled toother components of the SPAD circuit. For example, timer 612 may becoupled to resent transistor 608 or any other suitable component.

A double-triggering event may occur when SPAD 602 detects a first photonand in a subsequent time period while anode 604 of SPAD 602 dischargesto ground, SPAD 602 detects a second photon. A potential timing for suchan event is shown in FIG. 7A, which illustrates an exemplary timingdiagram 700 for a conventional photodetector system. Timing diagram isdescribed with reference to SPAD 602, though configuration 600 is not aconventional photodetector system. Timing diagram 700 shows on a y-axis702 a voltage measurement at anode 604, V_(anode), of SPAD 602 mappedagainst time on an x-axis 704. A voltage curve 706 shows a change involtage at anode 604 when SPAD 602 detects a photon. At time T₀, SPAD602 detects a photon, SPAD 602 fires and V_(anode) increases from 0 toan excess bias voltage, V_(bias). The excess bias voltage is equal to acathode voltage (V_(cathode)) of SPAD 602 minus a breakdown voltage ofSPAD 602.

From time T₀, quench transistor 610 limits an amount of current flowingthrough SPAD 602 and starts to discharge anode 604 to ground, as shownin the decrease in voltage curve 706 from time T₀ to time T_(x). A valueof time T_(x) is determined by a value of V_(quench), as time T_(x) isinversely proportional to V_(quench). While V_(anode) is discharging toground, between times T₀ and T_(x), a voltage across SPAD 602 is stillgreater than the breakdown voltage. As a result, SPAD 602 may fire againif SPAD 602 detects another photon. Many parameters of SPAD 602 (e.g., aphoton detection probability (PDP), a dark current, after pulsing, etc.)may be dependent on the voltage across SPAD 602 when SPAD 602 fires. Butas an exact voltage of SPAD 602 between times T₀ and T_(x) may beindeterminate, a second firing (double-triggering event) of SPAD 602 mayresult in unexpected parameters and characteristics. Consequently, thesecond firing may draw more current without providing usefulinformation.

FIG. 7B illustrates an exemplary timing diagram 720 for an efficientfast-gating photodetector architecture, such as configuration 600.Timing diagram 720 shows on a y-axis 722 a voltage measurement at anode604, V_(anode), of SPAD 602 mapped against time on an x-axis 724. Avoltage curve 726 shows a change in voltage at anode 604 when SPAD 602detects a photon, with the control system implementing timer 612. Attime T₁, SPAD 602 detects a photon, SPAD 602 fires and SPAD 602 is thendisarmed by setting V_(anode) to a value greater than V_(bias), such asV_(SPADoff). V_(anode) may be kept at V_(SPADoff) until timer 612reaches a time T_(z). A value of time T_(z) may be based on apredetermined amount of time from T₁ and/or a predetermined amount oftime relative to a light pulse. For example, time T_(z) may be set to atime after a light pulse subsequent to SPAD 602 detecting the photon. Bysetting time T_(z) to after the subsequent light pulse, SPAD 602 mayavoid detecting photons directly from the subsequent light pulse andinstead be armed for a measurement time period after the subsequentlight pulse (e.g., after the subsequent light pulse reflects off of atarget).

While timing diagrams 700 and 720 show an anode voltage of a SPADchanging with respect to time, in other implementations, an anode of theSPAD may be connected to ground and a cathode voltage of the SPAD may bechanging with respect to time. Such implementations may analogously usea timer to control a current drawn by a SPAD circuit.

While each of implementations 200, 300, 400, 500, and 600 have beendescribed independently of each other, some embodiments of the controlsystem may combine components of any or all implementations 200 through600.

FIG. 8 illustrates various components included in an exemplaryfast-gated photodetector 802. As shown, photodetector 802 includes aSPAD circuit 804, a control circuit 806, a time-to-digital converter(TDC) 808, and a signal processing circuit 810.

SPAD circuit 804 may include a SPAD and various other electricalcomponents configured to operate together to detect a photon incidentupon the SPAD. As will be described below, SPAD circuit 804 may generatean output pulse when SPAD circuit 804 detects a photon. Variousimplementations of SPAD circuit 804 will be described in detail below.

Control circuit 806 may be implemented by an application specificintegrated circuit (ASIC) or any other suitable circuit configured tocontrol an operation of various components within SPAD circuit 804. Forexample, as will be described in more detail below, control circuit 806may output control logic that controls an operation of one or moreswitches within SPAD circuit 804 to selectively charge a capacitorwithin SPAD circuit 804 and put the SPAD included in the SPAD circuit804 in either an armed or a disarmed state. In some examples, controlcircuit 806 may control a gate delay, which specifies a predeterminedamount of time control circuit 806 is to wait after an occurrence of alight pulse (e.g., a laser pulse) to put the SPAD in the armed state. Tothis end, control circuit 806 may receive light pulse timinginformation, which indicates a time at which a light pulse occurs (e.g.,a time at which the light pulse is applied to tissue within the brain).Control circuit 806 may also control a programmable gate width, whichspecifies how long the SPAD is kept in the armed state before beingdisarmed.

Control circuit 806 is further configured to control signal processingcircuit 810. For example, control circuit 806 may provide histogramparameters to signal processing circuit 810. Signal processing circuit810 may generate histogram data in accordance with the histogramparameters.

TDC 808 is configured to measure a time difference between an occurrenceof an output pulse generated by SPAD circuit 804 and an occurrence of alight pulse. To this end, TDC 808 may also receive the same light pulsetiming information that control circuit 806 receives. TDC 808 may beimplemented by any suitable circuitry as may serve a particularimplementation.

Signal processing circuit 810 is configured to perform one or moresignal processing operations on data output by TDC 808. For example,signal processing circuit 810 may generate histogram data based on thedata output by TDC 808 and in accordance with histogram parametersprovided by control circuit 806. To illustrate, signal processingcircuit 810 may generate, store, transmit, compress, analyze, decode,and/or otherwise process histograms based on the data output by TDC 808.In some examples, signal processing data 810 may provide processed datato control circuit 806, which may use the processed data in any suitablemanner.

FIG. 9A illustrates an exemplary photodetector system 900 that may beused in accordance with the systems and methods described herein.Photodetector system 900 may implement any of the photodetector systemsdescribed herein. As shown, photodetector system 900 includes a lightsource 902 and a plurality of SPAD circuits 904 (e.g., SPAD circuits904-1 through 904-16) disposed on a printed circuit board (PCB) 906.Alternatively, SPAD circuits 904 (and the other components ofphotodetector system 900) may be disposed on an ASIC. Photodetectorsystem 900 further includes a control circuit 908 common to SPADs 904, asignal processing circuit 910 common to SPADs 904, and a TDC array 912that includes a plurality of TDCs each corresponding to one of the SPADcircuits 904. Control circuit 908, signal processing circuit 910, andTDC array 912 may each be disposed on PCB 906, as shown in FIG. 9A, orlocated elsewhere within photodetector system 900. Each SPAD circuit 904in combination with a TDC included in TDC array 912, control circuit908, and signal processing circuit 904 may implement a particularphotodetector. Hence, photodetector system 900 may be said to include anarray of photodetectors.

Light source 902 may be configured to generate one or more light pulsesat one or more wavelengths that may be applied to a desired target(e.g., a target within the brain). Light source 902 may be implementedby any suitable combination of components. For example, light source 902may be implemented by a laser source that generates laser pulses. Lightsource may be implemented on PCB 906 or external to PCB 906.

SPAD circuits 904 are each similar in operation to SPAD circuit 804 andmay be configured to detect photons of a light pulse generated by lightsource 902 after the photons reflect or scatter from a target (e.g., atarget internal to a user, such as brain tissue). SPAD circuits 904 mayalso be used to detect photons reflected from any object due to ambientlight for imaging applications. In this case, light source 902 is notneeded since the photons are generated by either ambient light oranother light source.

As shown, SPAD circuits 904 are arranged in a four-by-four array on PCB906. The positioning of each SPAD circuit 904 may correspond, forexample, to a pixel within a pixel array. SPAD circuits 904 mayalternatively be arranged in any suitable manner. While sixteen SPADcircuits 904 are shown in FIG. 9A, it will be recognized that any numberof SPAD circuits 904 may be included in photodetector system 900.

Control circuit 908 may be similar in function to control circuit 806,and may be configured to control each of SPAD circuits 908. Signalprocessing circuit 910 may be similar in function to signal processingcircuit 810, and may be configured to process signals output by each ofSPAD circuits 904. TDC array 912 may include a plurality of TDCs eachsimilar to TDC 808 and configured to measure a time difference betweenthe occurrence of a light pulse 902 and output pulses generated by eachof SPAD circuits 904.

Any of the photodetector systems described herein (e.g., photodetectorsystem 100 and/or photodetector system 900) may be implemented by orincluded in any suitable device. For example, photodetector system 100and/or photodetector system 900 may be included in a non-invasivewearable device that a user may wear to perform one or more diagnostic,imaging, and/or consumer-related operations.

To illustrate, FIG. 9B shows an exemplary non-invasive wearable braininterface system 920 (“brain interface system 920”) that implements aphotodetector system, which may be similar to photodetector system 100and/or photodetector system 900. As shown, brain interface system 920includes a head-mountable component 922 configured to be attached to auser's head. Head-mountable component 922 may be implemented by a capshape that is worn on a head of a user. Alternative implementations ofhead-mountable component 922 include helmets, beanies, headbands, otherhat shapes, or other forms conformable to be worn on a user's head, etc.Head-mountable component 922 may be made out of any suitable cloth, softpolymer, plastic, hard shell, and/or any other suitable material as mayserve a particular implementation. Examples of headgears used withwearable brain interface systems are described more fully in U.S. Pat.No. 10,340,408, incorporated herein by reference in its entirety.

Head-mountable component 922 includes a plurality of photodetectors 924and a plurality of light sources 926 configured to generate lightpulses. It will be recognized that in some alternative embodiments,head-mountable component 922 may include a single photodetector 924and/or a single light source 926. For example, brain interface system920 may be used for controlling an optical path and for transformingphotodetector pixel measurements into an intensity value that representsan optical property of a brain tissue region. Brain interface system 920allows optical detection of deep anatomical location through skin andbone by extracting data from photons originating from light source 926to the target location, in contrast to traditional imaging systems andmethods (e.g., optical coherence tomography (OCT)), which only imagesuperficial tissue structures or through optically transparentstructures. While brain interface system 920 shows one head-mountablecomponent 922, any suitable number of head-mountable components may beused, for instance at different locations on the head.

Brain interface system 920 may further include a processor 928configured to communicate with (e.g., control and/or receive signalsfrom) photodetectors 924 and light sources 926 by way of a communicationlink 930. Communication link 930 may include any suitable wired and/orwireless communication link. Processor 928 may include any suitablehousing and may be located on the user's scalp, neck, shoulders, chest,or arm, as may be desirable. In some variations, processor 928 may beintegrated in the same assembly housing as photodetectors 924 and lightsources 926.

As shown, brain interface system 920 may optionally include a remoteprocessor 932 in communication with processor 928. For example, remoteprocessor 932 may store measured data from photodetectors 924 and/orprocessor 928 from previous detection sessions and/or from multiplebrain interface systems (not shown). Power for photodetectors 924, lightsources 926, and/or processor 928 may be provided via a wearable battery(not shown). In some examples, processor 928 and the battery may beenclosed in a single housing, and wires carrying power signals fromprocessor 928 and the battery may extend to photodetectors 924 and lightsources 926. Alternatively, power may be provided wirelessly (e.g., byinduction).

In some alternative embodiments, head mountable component 922 does notinclude individual light sources. Instead, a light source configured togenerate the light that is detected by photodetector 924 may be includedelsewhere in brain interface system 920. For example, a light source maybe included in processor 928 and coupled to photodetector units 924through electrical connections.

Each of the light sources described herein may be implemented by anysuitable device. For example, a light source as used herein may be, forexample, a distributed feedback (DFB) laser, a super luminescent diode(SLD), a light emitting diode (LED), a diode-pumped solid-state (DPSS)laser, a laser diode (LD), a super luminescent light emitting diode(sLED), a vertical-cavity surface-emitting laser (VCSEL), a titaniumsapphire laser, a micro light emitting diode (mLED), and/or any othersuitable laser or light source.

Photodetector system 900 shown in FIG. 9A may alternatively be includedin a non-wearable device (e.g., a medical device and/or consumer devicethat is placed near the head or other body part of a user to perform oneor more diagnostic, imaging, and/or consumer-related operations).Photodetector system 900 may alternatively be included in a sub-assemblyenclosure of a wearable invasive device (e.g., an implantable medicaldevice for brain recording and imaging).

Any suitable SPAD circuits may be used in the photodetectorarchitectures described herein. Some of the SPAD circuits describedherein are gated with a capacitor (or, in some cases, with a parasiticcapacitance of the SPAD itself) that is pre-charged with a bias voltagebefore a command is provided to arm the SPAD. This is described morefully in U.S. Pat. No. 10,158,038, incorporated above by reference inits entirety.

FIG. 10 illustrates an exemplary computing device 1000 that may bespecifically configured to perform one or more of the processesdescribed herein. As shown in FIG. 10, computing device 1000 may includea communication interface 1002, a processor 1004, a storage device 1006,and an input/output (“I/O”) module 1008 communicatively connected one toanother via a communication infrastructure 1010. While an exemplarycomputing device 1000 is shown in FIG. 10, the components illustrated inFIG. 10 are not intended to be limiting. Additional or alternativecomponents may be used in other embodiments. Components of computingdevice 1000 shown in FIG. 10 will now be described in additional detail.

Communication interface 1002 may be configured to communicate with oneor more computing devices. Examples of communication interface 1002include, without limitation, a wired network interface (such as anetwork interface card), a wireless network interface (such as awireless network interface card), a modem, an audio/video connection,and any other suitable interface.

Processor 1004 generally represents any type or form of processing unitcapable of processing data and/or interpreting, executing, and/ordirecting execution of one or more of the instructions, processes,and/or operations described herein. Processor 1004 may performoperations by executing computer-executable instructions 1012 (e.g., anapplication, software, code, and/or other executable data instance)stored in storage device 1006.

Storage device 1006 may include one or more data storage media, devices,or configurations and may employ any type, form, and combination of datastorage media and/or device. For example, storage device 1006 mayinclude, but is not limited to, any combination of the non-volatilemedia and/or volatile media described herein. Electronic data, includingdata described herein, may be temporarily and/or permanently stored instorage device 1006. For example, data representative ofcomputer-executable instructions 1012 configured to direct processor1004 to perform any of the operations described herein may be storedwithin storage device 1006. In some examples, data may be arranged inone or more databases residing within storage device 1006.

I/O module 1008 may include one or more I/O modules configured toreceive user input and provide user output. I/O module 1008 may includeany hardware, firmware, software, or combination thereof supportive ofinput and output capabilities. For example, I/O module 1008 may includehardware and/or software for capturing user input, including, but notlimited to, a keyboard or keypad, a touchscreen component (e.g.,touchscreen display), a receiver (e.g., an RF or infrared receiver),motion sensors, and/or one or more input buttons.

I/O module 1008 may include one or more devices for presenting output toa user, including, but not limited to, a graphics engine, a display(e.g., a display screen), one or more output drivers (e.g., displaydrivers), one or more audio speakers, and one or more audio drivers. Incertain embodiments, I/O module 1008 is configured to provide graphicaldata to a display for presentation to a user. The graphical data may berepresentative of one or more graphical user interfaces and/or any othergraphical content as may serve a particular implementation.

In some examples, any of the systems, computing devices, processors,controller units, and/or other components described herein may beimplemented by computing device 1000. For example, components of controlsystem 110 may be implemented by processor 1004.

The following aspects may be considered as one or more combinations offeatures contemplated herein. However, the following aspects are not tobe considered limiting, and more or fewer features of each combinationhave also been contemplated.

Aspect 1. A system comprising: an array of photodetectors comprising afirst photodetector comprising: a single-photon avalanche diode (SPAD),and a fast-gating circuit configured to arm and disarm the SPAD; and acontrol system for controlling a current drawn by the array ofphotodetectors.

Aspect 2. The system of aspect 1, wherein the control system comprises aplurality of switches connected in parallel to an anode of the SPAD.

Aspect 3. The system of aspect 2, wherein: the fast-gating circuitcomprises a gating transistor gated by a gating voltage, and each switchof the plurality of switches is connected to a respective additionaltransistor gated by the gating voltage.

Aspect 4. The system of any of aspects 2-3, wherein the control systemis configured to control the amount of current drawn by controlling theplurality of switches to control a slew rate of the fast-gating circuit.

Aspect 5. The system of any of aspects 1-4, wherein the control systemfurther comprises a quenching transistor connected in parallel with theplurality of switches, the quenching transistor configured to control anavalanche current drawn by the SPAD.

Aspect 6. The system of any of aspects 1-5, wherein the control systemcomprises a plurality of switches connected in parallel between an anodeof the SPAD and a transistor configured to control a disarming of theSPAD; and the control system is configured to control the amount ofcurrent drawn by controlling the plurality of switches to control a slewrate of the fast-gating circuit.

Aspect 7. The system of any of aspects 1-6, wherein the control systemcomprises a plurality of voltage sources configured to gate a gatingtransistor of the fast-gating circuit; the array of photodetectorscomprises: a first subset of photodetectors including the firstphotodetector, each photodetector of the first subset of photodetectorsconnected to a first voltage source of the plurality of voltage sources,and a second subset of photodetectors, each photodetector of the secondsubset of photodetectors connected to a second voltage source of theplurality of voltage sources; and the control system is configuredcontrol the amount of current drawn by controlling the plurality ofvoltage sources to selectively arm the first subset of photodetectorsand the second subset of photodetectors.

Aspect 8. The system of aspect 7, wherein the first and second subsetsof photodetectors are determined based on a characteristic of thephotodetectors.

Aspect 9. The system of aspect 8, wherein the characteristic of thephotodetectors includes a dark count, and the determining of the subsetsof photodetectors includes grouping photodetectors with a larger darkcount rate in the first subset of photodetectors and photodetectors witha smaller dark count rate in the second subset of photodetectors.

Aspect 10. The system of any of aspects 7-9, wherein: the array ofphotodetectors is configured to measure a light pulse response of atarget; and the subsets of photodetectors are determined based on acharacteristic of the light pulse response.

Aspect 11. The system of any of aspects 1-10, wherein the control systemis configured to control the amount of current drawn by abstaining fromdisarming the SPAD during one or more measurement time periods.

Aspect 12. The system of aspect 11, wherein: the control system includesan OR gate coupled to a transistor of the fast-gating circuit configuredto disarm the SPAD; and the control system is configured to abstain fromdisarming the SPAD by providing a signal to the array of photodetectorsconfigured to keep open the transistor of the fast-gating circuitconfigured to disarm the SPAD.

Aspect 13. The system of any of aspects 1-12, wherein: the controlsystem comprises a timer coupled to a gating transistor of thefast-gating circuit, the timer configured to disarm the SPAD subsequentto the SPAD detecting a photon until a particular point in time relativeto a light pulse; and the control system is configured to control theamount of current drawn by controlling the timer.

Aspect 14. The system of aspect 13, wherein the timer is configured todisarm the SPAD by setting an anode voltage of the SPAD to a valuegreater than a difference between a cathode voltage of the SPAD and abreakdown voltage of the SPAD.

Aspect 15. The system of any of aspects 13-14, wherein the particularpoint in time is a time after a light pulse subsequent to the SPADdetecting the photon.

In the preceding description, various exemplary embodiments have beendescribed with reference to the accompanying drawings. It will, however,be evident that various modifications and changes may be made thereto,and additional embodiments may be implemented, without departing fromthe scope of the invention as set forth in the claims that follow. Forexample, certain features of one embodiment described herein may becombined with or substituted for features of another embodimentdescribed herein. The description and drawings are accordingly to beregarded in an illustrative rather than a restrictive sense.

What is claimed is:
 1. A system comprising: an array of photodetectors comprising a first photodetector comprising: a single-photon avalanche diode (SPAD), and a fast-gating circuit configured to arm and disarm the SPAD; and a control system for controlling a current drawn by the array of photodetectors.
 2. The system of claim 1, wherein the control system comprises a plurality of switches connected in parallel to an anode or a cathode of the SPAD.
 3. The system of claim 2, wherein: the fast-gating circuit comprises a gating transistor gated by a gating voltage, and each switch of the plurality of switches is connected to a respective additional transistor gated by the gating voltage.
 4. The system of claim 2, wherein the control system is configured to control the amount of current drawn by controlling the plurality of switches to control a slew rate of the fast-gating circuit.
 5. The system of claim 2, wherein the control system further comprises a quenching transistor connected in parallel with the plurality of switches, the quenching transistor configured to control an avalanche current drawn by the SPAD.
 6. The system of claim 1, wherein the control system comprises a plurality of switches connected in parallel between an anode or a cathode of the SPAD and a transistor configured to control a disarming of the SPAD; and the control system is configured to control the amount of current drawn by controlling the plurality of switches to control a slew rate of the fast-gating circuit.
 7. The system of claim 1, wherein the control system comprises a plurality of voltage sources configured to gate a gating transistor of the fast-gating circuit; the array of photodetectors comprises: a first subset of photodetectors including the first photodetector, each photodetector of the first subset of photodetectors connected to a first voltage source of the plurality of voltage sources, and a second subset of photodetectors, each photodetector of the second subset of photodetectors connected to a second voltage source of the plurality of voltage sources; and the control system is configured control the amount of current drawn by controlling the plurality of voltage sources to selectively arm the first subset of photodetectors and the second subset of photodetectors.
 8. The system of claim 7, wherein the first and second subsets of photodetectors are determined based on a characteristic of the photodetectors.
 9. The system of claim 8, wherein the characteristic of the photodetectors includes a dark count, and the determining of the subsets of photodetectors includes grouping photodetectors with a larger dark count rate in the first subset of photodetectors and photodetectors with a smaller dark count rate in the second subset of photodetectors.
 10. The system of claim 7, wherein: the array of photodetectors is configured to measure a light pulse response of a target; and the subsets of photodetectors are determined based on a characteristic of the light pulse response.
 11. The system of claim 1, wherein the control system is configured to control the amount of current drawn by abstaining from disarming the SPAD during one or more measurement time periods.
 12. The system of claim 11, wherein: the control system includes a combinational logic gate coupled to a transistor of the fast-gating circuit configured to disarm the SPAD; and the control system is configured to abstain from disarming the SPAD by providing a signal to the array of photodetectors configured to keep open the transistor of the fast-gating circuit configured to disarm the SPAD.
 13. The system of claim 1, wherein: the control system comprises a timer coupled to the fast-gating circuit, the timer configured to disarm the SPAD subsequent to the SPAD detecting a photon until a particular point in time relative to a light pulse; and the control system is configured to control the amount of current drawn by controlling the timer.
 14. The system of claim 13, wherein the timer is configured to disarm the SPAD by setting a voltage across the SPAD to a value smaller than a breakdown voltage of the SPAD.
 15. The system of claim 13, wherein the particular point in time is a time after a light pulse subsequent to the SPAD detecting the photon.
 16. The system of claim 1, wherein: the control system comprises a plurality of switches connected in parallel to an anode or a cathode of the SPAD; the control system is configured to control the amount of current drawn by at least one of: controlling the plurality of switches to control a slew rate of the fast-gating circuit, and abstaining from disarming the SPAD during one or more measurement time periods.
 17. A system comprising: an array of photodetectors comprising a first photodetector comprising: a single photon avalanche diode (SPAD), a fast-gating circuit configured to arm and disarm the SPAD; and a control system comprising a plurality of switches connected in parallel to the SPAD, the control system configured to control an amount of current drawn by the array of photodetectors by controlling the plurality of switches to control a slew rate of the fast-gating circuit.
 18. The system of claim 17, wherein the plurality of switches is connected to an anode or a cathode of the SPAD.
 19. The system of claim 17, wherein the plurality of switches is connected between an anode or a cathode of the SPAD and a transistor configured to control disarming of the SPAD.
 20. The system of claim 17, wherein: the fast-gating circuit comprises a gating transistor gated by a gating voltage, and each switch of the plurality of switches is connected to a respective additional transistor gated by the gating voltage.
 21. The system of claim 17, wherein the first photodetector further comprises a quenching circuit connected in parallel with the plurality of switches.
 22. The system of claim 17, wherein the control system is further configured to control the current drawn by abstaining from disarming the SPAD.
 23. A system comprising: an array of photodetectors comprising a first subset of photodetectors and a second subset of photodetectors, the first subset of photodetectors including a first photodetector comprising: a single photon avalanche diode (SPAD), and a fast-gating circuit configured to arm and disarm the SPAD; a plurality of voltage sources including a first voltage source and a second voltage source; and a control system configured to control an amount of current drawn by the array of photodetectors, wherein the plurality of voltage sources are configured to gate a gating transistor of the fast-gating circuit, the first subset of photodetectors is connected to the first voltage source, the second subset of photodetectors is connected to the second voltage source, and the control system is configured to control an amount of current drawn by selectively arming the first subset and the second subset of photodetectors.
 24. The system of claim 23, wherein the subsets of photodetectors are determined based on a characteristic of the photodetectors.
 25. The system of claim 24, wherein the characteristic of the photodetectors includes a dark count, and the determining of the subsets of photodetectors includes the first subset of photodetectors comprising photodetectors with a larger dark count rate than the second subset of photodetectors.
 26. The system of claim 23, wherein: the array of photodetectors is configured to measure a light pulse response of a target; and the subsets of photodetectors are determined based on a characteristic of the light pulse response.
 27. The system of claim 23, wherein the control system further comprises a plurality of switches connected in parallel to an anode or a cathode of the SPAD, and the control system is further configured to control the amount of current drawn by controlling the plurality of switches to control a slew rate of the fast-gating circuit.
 28. The system of claim 27, wherein the control system is further configured to control the amount of current drawn by abstaining from disarming the SPAD during one or more measurement time periods.
 29. The system of claim 28, wherein the control system further comprises a timer coupled to the gating transistor of the fast-gating circuit, wherein: the timer configured to disarm the SPAD subsequent to the SPAD detecting a photon until a particular point in time relative to a light pulse, and the control system is further configured to control an amount of current drawn by controlling the timer.
 30. The system of claim 27, wherein the control system further comprises a timer coupled to the gating transistor of the fast-gating circuit, wherein: the timer configured to disarm the SPAD subsequent to the SPAD detecting a photon until a particular point in time relative to a light pulse, and the control system is further configured to control an amount of current drawn by controlling the timer.
 31. The system of claim 23, wherein the control system further comprises a timer coupled to the gating transistor of the fast-gating circuit, wherein: the timer configured to disarm the SPAD subsequent to the SPAD detecting a photon until a particular point in time relative to a light pulse, and the control system is further configured to control an amount of current drawn by controlling the timer.
 32. The system of claim 31, wherein the control system is further configured to control the amount of current drawn by abstaining from disarming the SPAD during one or more measurement time periods.
 33. A system comprising: an array of photodetectors comprising a first photodetector comprising: a single photon avalanche diode (SPAD), and a fast-gating circuit configured to arm and disarm the SPAD; and a control system configured to control an amount of current drawn by the array of photodetectors by abstaining from disarming the SPAD during one or more measurement time periods.
 34. The system of claim 33, wherein: the first photodetector includes a combinational logic gate coupled to a transistor of the fast-gating circuit configured to disarm the SPAD; and the control system is configured to abstain from disarming the SPAD by providing a signal to the array of photodetectors configured to keep open the transistor of the fast-gating circuit configured to disarm the SPAD.
 35. A system comprising: an array of photodetectors comprising a first photodetector comprising: a single photon avalanche diode (SPAD), a fast-gating circuit configured to arm and disarm the SPAD; and a control system comprising a timer coupled to a gating transistor of the fast-gating circuit, the timer configured to disarm the SPAD subsequent to the SPAD detecting a photon until a particular point in time relative to a light pulse, the control system configured to control an amount of current drawn by the array of photodetectors by controlling the timer.
 36. The system of claim 35, wherein the timer is configured to disarm the SPAD by setting the voltage across the SPAD less than the breakdown voltage of the SPAD.
 37. The system of claim 35, wherein the particular point in time is a time after a light pulse subsequent to the SPAD detecting the photon. 